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oai:u-ryukyu.repo.nii.ac.jp:02000969
2023-08-03T05:43:13Z
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Surface roughening in electrodeposited nickel films on ITO glasses at a low current density
Saitou, Masatoshi
Makabe, A
Tomoyose, T
open access
Nickel
Electrochemical methods
Surface roughening
Surface morphology
Atomic Force Microscopy
X-ray diffraction
Electron-solid diffraction
We have studied the kinetic surface roughening of nickel films electrodeposited on ITO glasses at a low current density using atomic force microscopy (AFM), electron and X-ray diffraction. The AFM images of the nickel films exhibited the scaling relations represented by the growth exponent beta = 0.78 +/- 0.03 and the roughness exponent alpha = 0.96 +/- 0.04, which is in good agreement with the prediction by the diffusion-driven growth model. Electron and X-ray diffraction revealed a preferred growth orientation of the electrodeposited nickel films, which gives an explanation for the growth exponent beta greater than 1/2.
論文
Elsevier Science B.V.
2000-07-01
eng
journal article
AM
http://hdl.handle.net/20.500.12000/394
http://hdl.handle.net/20.500.12000/394
https://u-ryukyu.repo.nii.ac.jp/records/2000969
http://www.sciencedirect.com/science/journal/00396028
10.1016/S0039-6028(00)00551-3
0039-6028
AA00853803
Surface Science
459
1-2
L462
L466
https://u-ryukyu.repo.nii.ac.jp/record/2000969/files/9-SurfaceSci_459(1-2)L462.pdf