2024-03-29T00:00:35Z
https://u-ryukyu.repo.nii.ac.jp/oai
oai:u-ryukyu.repo.nii.ac.jp:02004878
2022-10-31T02:24:53Z
1642837622505:1642837855274:1642837863705
1642838403551:1642838406845
X線2面入射法による結晶面傾斜角およびX線屈折率の測定
Measurements of the off-Angle of Crystal Surface and the Index of the Crystal for X-rays by X-ray Double Incidence Method
前濱, 剛廣
安冨祖, 忠信
Maehama, Takwhiro
Afuso, Chushin
open access
X-rays
double-crystal method
gallium arsenide
A new X-ray double incidence method, by which off-angle of crystal surface and the refractive index of the crystal for X-rays are measured exactly, is presented. X-rays which are Bragg-reflected at the first crystal strike both faces of the second crystal, i. e., the surface and the side at the same time. Because of the refractive effect both X-rays propagate in the second crystal in slightly different directions each other. Therefore, the rocking curve which is measured by rotating the second crystal about the axis perpendicular to the incident plane has two peaks. From the angle between two peaks of the rocking curve, off-angle of the surface of the second crystal and the refractive index of the crystal for X-rays are calculated. In order to confirm the exactness of the new method, it is applied to two specimens of GaAs crystal. One is Cr-doped SI- GaAs with the surface offed by 2±0.5°in [01^^-1^^] direction from (100) plane and another is Si-doped n- GaAs with the surface offed by 3±0.5°in [001^^] direction from (100) plane. The measured off-angles of these specimens are 2.211°and 2.987°, respectively. The measured values of refractive index of these specimens are 0.99998493 and 0.99998361. They agree well with the value given by the lorentz dispersion formula, 0.99998492.
紀要論文
琉球大学工学部
1988-09
jpn
departmental bulletin paper
VoR
http://hdl.handle.net/20.500.12000/12450
http://hdl.handle.net/20.500.12000/12450
https://u-ryukyu.repo.nii.ac.jp/records/2004878
AN0025048X
琉球大学工学部紀要
36
55
62
https://u-ryukyu.repo.nii.ac.jp/record/2004878/files/No36p055.pdf