{"created":"2022-01-24T09:11:44.520438+00:00","id":2000829,"links":{},"metadata":{"_buckets":{"deposit":"4ce4b535-8344-47ae-bc1a-d02a8132d9de"},"_deposit":{"id":"2000829","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"2000829"},"status":"published"},"_oai":{"id":"oai:u-ryukyu.repo.nii.ac.jp:02000829","sets":["1642838163960:1642838338003","1642838403551:1642838406845"]},"author_link":[],"item_1617186331708":{"attribute_name":"Title","attribute_value_mlt":[{"subitem_1551255647225":"アノード溶解したニッケル薄膜の表面フラクタル次元","subitem_1551255648112":"ja"},{"subitem_1551255647225":"Surface Fractal Dimension of Anodic Dissolved Nickel Films","subitem_1551255648112":"en"}]},"item_1617186419668":{"attribute_name":"Creator","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"真壁, 朝宏","creatorNameLang":"ja"}]},{"creatorNames":[{"creatorName":"押川, 渡","creatorNameLang":"ja"}]},{"creatorNames":[{"creatorName":"斉藤, 正敏","creatorNameLang":"ja"}]},{"creatorNames":[{"creatorName":"Makabe, Asahiro","creatorNameLang":"en"}]},{"creatorNames":[{"creatorName":"Oshikawa, Wataru","creatorNameLang":"en"}]},{"creatorNames":[{"creatorName":"Saitou, Masatoshi","creatorNameLang":"en"}]}]},"item_1617186476635":{"attribute_name":"Access Rights","attribute_value_mlt":[{"subitem_1522299639480":"open access","subitem_1600958577026":"http://purl.org/coar/access_right/c_abf2"}]},"item_1617186499011":{"attribute_name":"Rights","attribute_value_mlt":[{"subitem_1522650717957":"ja","subitem_1522651041219":"Copyright (c) 2001 日本機械学会"}]},"item_1617186609386":{"attribute_name":"Subject","attribute_value_mlt":[{"subitem_1522299896455":"en","subitem_1522300014469":"Other","subitem_1523261968819":"Electrochemistry"},{"subitem_1522299896455":"en","subitem_1522300014469":"Other","subitem_1523261968819":"Surface Roughness"},{"subitem_1522299896455":"en","subitem_1522300014469":"Other","subitem_1523261968819":"Fractal"},{"subitem_1522299896455":"en","subitem_1522300014469":"Other","subitem_1523261968819":"Nickel"},{"subitem_1522299896455":"en","subitem_1522300014469":"Other","subitem_1523261968819":"Surface Morphology"},{"subitem_1522299896455":"en","subitem_1522300014469":"Other","subitem_1523261968819":"Atomic Force Microscopy"}]},"item_1617186626617":{"attribute_name":"Description","attribute_value_mlt":[{"subitem_description":"Quantitative characterization of surfaces of anodic dissolved nickel films was performed using the roughness exponent, the Hurst rescaled range analysis and the Fourier transform of their AFM images. Of three methods, the first and second methods give almost the same fractal dimension 2.06 and 2.02 respectively, which indicate the roughness exponent α interchanged with the Hurst exponent, but the third method determines a little larger fractal dimension 2.25. The value of the fractal dimension, 2.0,implies that the anodic dissolved nickel films surface have no fractal structure.","subitem_description_type":"Other"},{"subitem_description":"論文","subitem_description_type":"Other"}]},"item_1617186643794":{"attribute_name":"Publisher","attribute_value_mlt":[{"subitem_1522300295150":"ja","subitem_1522300316516":"日本機械学会"}]},"item_1617186702042":{"attribute_name":"Language","attribute_value_mlt":[{"subitem_1551255818386":"jpn"}]},"item_1617186783814":{"attribute_name":"Identifier","attribute_value_mlt":[{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/20.500.12000/124"}]},"item_1617186920753":{"attribute_name":"Source Identifier","attribute_value_mlt":[{"subitem_1522646500366":"ISSN","subitem_1522646572813":"03875008"},{"subitem_1522646500366":"NCID","subitem_1522646572813":"AN0018742X"}]},"item_1617186941041":{"attribute_name":"Source Title","attribute_value_mlt":[{"subitem_1522650068558":"ja","subitem_1522650091861":"日本機械学会論文集. A編"},{"subitem_1522650068558":"en","subitem_1522650091861":"Transactions of the Japan Society of Mechanical Engineers. A"}]},"item_1617187056579":{"attribute_name":"Bibliographic Information","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2001-12-25","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"664","bibliographicPageEnd":"82","bibliographicPageStart":"79","bibliographicVolumeNumber":"67"}]},"item_1617258105262":{"attribute_name":"Resource Type","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_1617265215918":{"attribute_name":"Version Type","attribute_value_mlt":[{"subitem_1522305645492":"VoR","subitem_1600292170262":"http://purl.org/coar/version/c_970fb48d4fbd8a85"}]},"item_1617605131499":{"attribute_name":"File","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_access","filename":"saitou_m01.pdf","mimetype":"application/pdf","url":{"objectType":"fulltext","url":"https://u-ryukyu.repo.nii.ac.jp/record/2000829/files/saitou_m01.pdf"},"version_id":"31a007bb-3b78-4930-aea8-b44ccff2db6a"}]},"item_title":"アノード溶解したニッケル薄膜の表面フラクタル次元","item_type_id":"15","owner":"1","path":["1642838338003","1642838406845"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2007-03-04"},"publish_date":"2007-03-04","publish_status":"0","recid":"2000829","relation_version_is_last":true,"title":["アノード溶解したニッケル薄膜の表面フラクタル次元"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-08-03T05:27:11.117960+00:00"}