@article{oai:u-ryukyu.repo.nii.ac.jp:02000969,
 author = {Saitou, Masatoshi and Makabe, A and Tomoyose, T},
 issue = {1-2},
 journal = {Surface Science},
 month = {Jul},
 note = {We have studied the kinetic surface roughening of nickel films electrodeposited on ITO glasses at a low current density using atomic force microscopy (AFM), electron and X-ray diffraction. The AFM images of the nickel films exhibited the scaling relations represented by the growth exponent beta = 0.78 +/- 0.03 and the roughness exponent alpha = 0.96 +/- 0.04, which is in good agreement with the prediction by the diffusion-driven growth model. Electron and X-ray diffraction revealed a preferred growth orientation of the electrodeposited nickel films, which gives an explanation for the growth exponent beta greater than 1/2., 論文},
 pages = {L462--L466},
 title = {Surface roughening in electrodeposited nickel films on ITO glasses at a low current density},
 volume = {459},
 year = {2000}
}