{"created":"2022-01-24T16:36:34.048820+00:00","id":2000969,"links":{},"metadata":{"_buckets":{"deposit":"137e1f6c-2795-467a-b47a-b491b98a4f45"},"_deposit":{"id":"2000969","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"2000969"},"status":"published"},"_oai":{"id":"oai:u-ryukyu.repo.nii.ac.jp:02000969","sets":["1642838163960:1642838338003","1642838403551:1642838406845"]},"author_link":[],"item_1617186331708":{"attribute_name":"Title","attribute_value_mlt":[{"subitem_1551255647225":"Surface roughening in electrodeposited nickel films on ITO glasses at a low current density","subitem_1551255648112":"en"}]},"item_1617186419668":{"attribute_name":"Creator","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Saitou, Masatoshi","creatorNameLang":"en"}]},{"creatorNames":[{"creatorName":"Makabe, A","creatorNameLang":"en"}]},{"creatorNames":[{"creatorName":"Tomoyose, T","creatorNameLang":"en"}]}]},"item_1617186476635":{"attribute_name":"Access Rights","attribute_value_mlt":[{"subitem_1522299639480":"open access","subitem_1600958577026":"http://purl.org/coar/access_right/c_abf2"}]},"item_1617186609386":{"attribute_name":"Subject","attribute_value_mlt":[{"subitem_1522299896455":"en","subitem_1522300014469":"Other","subitem_1523261968819":"Nickel"},{"subitem_1522299896455":"en","subitem_1522300014469":"Other","subitem_1523261968819":"Electrochemical methods"},{"subitem_1522299896455":"en","subitem_1522300014469":"Other","subitem_1523261968819":"Surface roughening"},{"subitem_1522299896455":"en","subitem_1522300014469":"Other","subitem_1523261968819":"Surface morphology"},{"subitem_1522299896455":"en","subitem_1522300014469":"Other","subitem_1523261968819":"Atomic Force Microscopy"},{"subitem_1522299896455":"en","subitem_1522300014469":"Other","subitem_1523261968819":"X-ray diffraction"},{"subitem_1522299896455":"en","subitem_1522300014469":"Other","subitem_1523261968819":"Electron-solid diffraction"}]},"item_1617186626617":{"attribute_name":"Description","attribute_value_mlt":[{"subitem_description":"We have studied the kinetic surface roughening of nickel films electrodeposited on ITO glasses at a low current density using atomic force microscopy (AFM), electron and X-ray diffraction. The AFM images of the nickel films exhibited the scaling relations represented by the growth exponent beta = 0.78 +/- 0.03 and the roughness exponent alpha = 0.96 +/- 0.04, which is in good agreement with the prediction by the diffusion-driven growth model. Electron and X-ray diffraction revealed a preferred growth orientation of the electrodeposited nickel films, which gives an explanation for the growth exponent beta greater than 1/2.","subitem_description_type":"Other"},{"subitem_description":"\u8ad6\u6587","subitem_description_type":"Other"}]},"item_1617186643794":{"attribute_name":"Publisher","attribute_value_mlt":[{"subitem_1522300295150":"en","subitem_1522300316516":"Elsevier Science B.V."}]},"item_1617186702042":{"attribute_name":"Language","attribute_value_mlt":[{"subitem_1551255818386":"eng"}]},"item_1617186783814":{"attribute_name":"Identifier","attribute_value_mlt":[{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/20.500.12000/394"}]},"item_1617186920753":{"attribute_name":"Source Identifier","attribute_value_mlt":[{"subitem_1522646500366":"ISSN","subitem_1522646572813":"0039-6028"},{"subitem_1522646500366":"NCID","subitem_1522646572813":"AA00853803"}]},"item_1617186941041":{"attribute_name":"Source Title","attribute_value_mlt":[{"subitem_1522650068558":"en","subitem_1522650091861":"Surface Science"}]},"item_1617187056579":{"attribute_name":"Bibliographic Information","attribute_value_mlt":[{"bibliographicIssueNumber":"1-2","bibliographicPageEnd":"L466","bibliographicPageStart":"L462","bibliographicVolumeNumber":"459"}]},"item_1617258105262":{"attribute_name":"Resource Type","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_1617265215918":{"attribute_name":"Version Type","attribute_value_mlt":[{"subitem_1522305645492":"AM","subitem_1600292170262":"http://purl.org/coar/version/c_ab4af688f83e57aa"}]},"item_1617353299429":{"attribute_name":"Relation","attribute_value_mlt":[{"subitem_1522306287251":{"subitem_1522306382014":"URI","subitem_1522306436033":"http://www.sciencedirect.com/science/journal/00396028"}},{"subitem_1522306287251":{"subitem_1522306382014":"DOI","subitem_1522306436033":"10.1016/S0039-6028(00)00551-3"}}]},"item_1617605131499":{"attribute_name":"File","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_access","filename":"9-SurfaceSci_459(1-2)L462.pdf","mimetype":"application/pdf","url":{"objectType":"fulltext","url":"https://u-ryukyu.repo.nii.ac.jp/record/2000969/files/9-SurfaceSci_459(1-2)L462.pdf"},"version_id":"602aaf51-ded3-4846-9929-836e4db1ad35"}]},"item_title":"Surface roughening in electrodeposited nickel films on ITO glasses at a low current density","item_type_id":"15","owner":"1","path":["1642838338003","1642838406845"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2007-04-18"},"publish_date":"2007-04-18","publish_status":"0","recid":"2000969","relation_version_is_last":true,"title":["Surface roughening in electrodeposited nickel films on ITO glasses at a low current density"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2022-02-14T20:43:42.121241+00:00"}