@article{oai:u-ryukyu.repo.nii.ac.jp:02019656,
 author = {Nagata, Yasunori and Mukaidono, Masao},
 issue = {9},
 journal = {IEICE transactions on fundamentals of electronics, communications and computer sciences},
 month = {Sep},
 note = {In this paper, a fault model for multiple-valued programmable logic arrays (MV-PLAs) is proposed and the equivalences of faults of MV-PLA's are discussed. In a supposed multiple-valued NOR/TSUM PLA model, it is shown that multiple-valued stuck-at faults, multiple-valued bridging faults, multiple-valued threshold shift faults and other some faults in a literal generator circuit are equivalent or subequivalent to a multiple crosspoint fault in the NOR plane or a multiple fault of weights in the TSUM plane. These results lead the fact that multiple-valued test vector set which indicates all multiple crosspoint fault and all multiple fault of weights also detects above equivalent or subequivalent faults in a MV-PLA.},
 pages = {1527--1534},
 title = {A Fault Model for Multiple-Valued PLA's and Its Equivalences},
 volume = {E77-A},
 year = {1994}
}